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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STM32F207VCT7 датащи(PDF) 149 Page - STMicroelectronics |
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STM32F207VCT7 датащи(HTML) 149 Page - STMicroelectronics |
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149 / 184 page  DocID15818 Rev 15 149/184 STM32F20xxx Electrical characteristics 183 Figure 73. NAND controller waveforms for common memory read access Figure 74. NAND controller waveforms for common memory write access Table 82. Switching characteristics for NAND Flash read cycles(1)(2) 1. CL = 30 pF. 2. Guaranteed by characterization results, not tested in production. Symbol Parameter Min Max Unit tw(N0E) FSMC_NOE low width 4THCLK- 1 4THCLK+ 2 ns tsu(D-NOE) FSMC_D[15-0] valid data before FSMC_NOE high 9 - ns th(NOE-D) FSMC_D[15-0] valid data after FSMC_NOE high 3 - ns td(ALE-NOE) FSMC_ALE valid before FSMC_NOE low - 3THCLK ns th(NOE-ALE) FSMC_NWE high to FSMC_ALE invalid 3THCLK+ 2 - ns |
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