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ST10F271E датащи(PDF) 132 Page - STMicroelectronics

номер детали ST10F271E
подробное описание детали  16-bit MCU with 128 Kbyte Flash memory and 8/12 Kbyte RAM
PDF  180 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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ST10F271E датащи(HTML) 132 Page - STMicroelectronics

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Electrical characteristics
ST10F271B/ST10F271E
132/180
Power Down supply current (12)
(RTC off, Oscillators off,
Main Voltage Regulator off)
IPD1
–200
µAT
A = 25°C
Power Down supply current (12)
(RTC on, Main Oscillator on,
Main Voltage Regulator off)
IPD2
400
Typical
Value
µAT
A = 25°C
Power Down supply current (12)
(RTC on, 32kHz Oscillator on,
Main Voltage Regulator off)
IPD3
–200
µAT
A = 25°C
Stand-by supply current (12)
(RTC off, Oscillators off, VDD off, VSTBY
on)
ISB1
–120
µA
VSTBY = 5.5 V
TA = TJ = 25°C
–500
µA
VSTBY = 5.5 V
TA = TJ = 125°C
Stand-by supply current (12)
(RTC on, 32kHz Oscillator on,
main VDD off, VSTBY on)
ISB2
–120
µA
VSTBY = 5.5 V
TA = TJ = 125°C
–500
µA
VSTBY = 5.5 V
TA = TJ = 125°C
Stand-by supply current (1) (12)
(VDD transient condition)
ISB3
–2.5
mA
1.
Not 100% tested, guaranteed by design characterization.
2.
This specification is not valid for outputs which are switched to open drain mode. In this case the respective output will float
and the voltage is imposed by the external circuitry.
3.
Port 5 leakage values are granted for not selected A/D Converter channel. One channels is always selected (by default,
after reset, P5.0 is selected). For the selected channel the leakage value is similar to that of other port pins.
4.
The leakage of P2.0 is higher than other pins due to the additional logic (pass gates active only in specific test modes)
implemented on input path. Pay attention to not stress P2.0 input pin with negative overload beyond the specified limits:
failures in Flash reading may occur (sense amplifier perturbation). Refer to next
Figure 37: Port2 test mode structure for a
scheme of the input circuitry.
5.
Overload conditions occur if the standard operating conditions are exceeded, i.e. the voltage on any pin exceeds the
specified range (i.e. VOV > VDD + 0.3 V or VOV < –0.3 V). The absolute sum of input overload currents on all port pins may
not exceed 50mA. The supply voltage must remain within the specified limits.
6.
This specification is only valid during Reset, or during Hold- or Adapt-mode. Port 6 pins are only affected, if they are used
for CS output and the open drain function is not enabled.
7.
The maximum current may be drawn while the respective signal line remains inactive.
8.
The minimum current must be drawn in order to drive the respective signal line active.
9.
The power supply current is a function of the operating frequency (fCPU is expressed in MHz). This dependency is
illustrated in the Figure 38 below. This parameter is tested at VDDmax and at maximum CPU clock frequency with all outputs
disconnected and all inputs at VIL or VIH, RSTIN pin at VIH1min: this implies I/O current is not considered. The device is
doing the following:
Fetching code from IRAM and XRAM1, accessing in read and write to both XRAM modules
Watchdog Timer is enabled and regularly serviced
RTC is running with main oscillator clock as reference, generating a tick interrupts every 192 clock cycles
Four channel of XPWM are running (waves period: 2, 2.5, 3 and 4 CPU clock cycles): no output toggling
Five General Purpose Timers are running in timer mode with prescaler equal to 8 (T2, T3, T4, T5, T6)
ADC is in Auto Scan Continuous Conversion mode on all 16 channels of Port5
All interrupts generated by XPWM, RTC, Timers and ADC are not serviced
Table 63.
DC characteristics (continued)
Parameter
Symbol
Limit values
Unit
Test Condition
min.
max.



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