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ST25R3916 датащи(PDF) 146 Page - STMicroelectronics

номер детали ST25R3916
подробное описание детали  High performance NFC universal device and EMVCo™ reader
PDF  157 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ST25R3916 датащи(HTML) 146 Page - STMicroelectronics

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Electrical characteristics
ST25R3916/7
146/157
DS12484 Rev 4
Table 130. 100 kHz AC characteristics(1)
Symbol
Alt.
Parameter
Min
Max
Unit
fC
fSCL
Clock frequency
-
100
kHz
tCHCL
tHIGH
Clock pulse width high
4000
-
ns
tCLCH
tLOW
Clock pulse width low
4700
-
tQL1QL2
tF
SDA (out) fall time
-
300
tDXCH
tSU:DAT
Data in set up time
250
-
tCLDXXtHD:DAT
Data in hold time
5000
-
tCLQX
tDH
Data out hold time
50
-
tCLQV
tAA
Clock low to next data valid (access time)
-
3450
tCHDL
tSU:STA
Start condition setup time
4700
-
tDLCL
tHD:STA
Start condition hold time
4000
-
tCHDH
tSU:STO
Stop condition set up time
4000
-
tDHDL
tBUF
Time between Stop condition and next
Start condition
4700
-
tNS(2)
-
Pulse width ignored (input filter on SCL
and SDA), single glitch
-40
1. Conditions in addition to those specified in Table 126 and Table 127.
2. Evaluated by characterization, not tested in production.
Table 131. 400 kHz AC characteristics(1) (2)
Symbol
Alt.
Parameter
Min
Max
Unit
fC
fSCL
Clock frequency
-
400
kHz
tCHCL
tHIGH
Clock pulse width high
600
-
ns
tCLCH
tLOW
Clock pulse width low
1300
-
tQL1QL2
tF
SDA (out) fall time
-
300
tDXCH
tSU:DAT
Data in set up time
100
-
tCLDXXtHD:DAT
Data in hold time
0
-
tCLQX
tDH
Data out hold time
50
-
tCLQV
tAA
Clock low to next data valid (access time)
-
900
tCHDL
tSU:STA
Start condition setup time
600
-
tDLCL
tHD:STA
Start condition hold time
600
-
tCHDH
tSU:STO
Stop condition set up time
600
-
tDHDL
tBUF
Time between Stop condition and next
Start condition
1300
-
tNS
-
Pulse width ignored (input filter on SCL
and SDA), single glitch
-40
1. Conditions in addition to those specified in Table 126 and Table 127.
2. Evaluated by characterization, not tested in production.



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