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STM32MP157C датащи(PDF) 209 Page - STMicroelectronics

номер детали STM32MP157C
подробное описание детали  Arm® dual Cortex®-A7 650 MHz Cortex®-M4 MPU, 3D GPU, TFT/DSI, 37 comm. interfaces, 29 timers, adv. analog, crypto
PDF  258 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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STM32MP157C датащи(HTML) 209 Page - STMicroelectronics

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DS12505 Rev 2
209/258
STM32MP157C
Electrical characteristics
238
6.3.26
DTS characteristics
6.3.27
VBAT ADC monitoring characteristics and charging characteristics
Table 84. Temperature sensor calibration values
Symbol
Parameter
Memory address
TS_CAL1
TS ADC raw data acquired at temperature of
30 °C ±5 °C
VDDA = VREF+ = 3.3 V ±10 mV
0x5C00 525C[15:0](1)(2)
1. It is mandatory to read a 32-bit word and to do relevant masking and shifting to isolate the required bits.
2. This address is located inside the BSEC and the access is allowed after being enabled in the RCC.
TS_CAL2
TS ADC raw data acquired at temperature of
130 °C ±2 °C
VDDA = VREF+ = 3.3 V ±10 mV
0x5C00 525C[31:16](1)(2)
Table 85. DTS characteristics(1)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fDTS
Output Clock frequency (PTAT
clock)
-
-
500
-
kHz
TSLOPE
Average slope
-
-
1600
-
Hz/°C
TL
Linearity with temperature (from
Output clock frequency).
VDDCORE = 1.2 V
-
-
3.8
°C
TTOTAL_
ERROR
Temperature measurement error
VDDCORE = 1.2 V
Temperature:
-40 to 125 °C
-5
-
+5
°C
TVDD
CORE
Additional error due to VDDCORE
variation
--
10
-
°C/V
tTRIM
Calibration time
-
2
-
-
ms
tWAKE_UP
Wake-up time from off state until
DTS ready signal = 1
--
50
-
μs
IDDCORE_DTS DTS consumption on VDDCORE
--
20
-
µA
1. Guaranteed by design.
Table 86. VBAT ADC monitoring characteristics
Symbol
Parameter
Min
Typ
Max
Unit
R
Resistor bridge for VBAT
-26
-
kΩ
Q
Ratio on VBAT measurement
-
4
-
-
Er(1)
1. Guaranteed by design.
Error on Q
–10
-
+10
%
tS_vbat(1)
ADC sampling time when reading VBAT input
9.8
-
-
µs



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