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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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L9680 датащи(PDF) 272 Page - STMicroelectronics |
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L9680 датащи(HTML) 272 Page - STMicroelectronics |
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272 / 277 page  Quality information L9680 272/277 DocID029257 Rev 1 17 Quality information 17.1 OTP memory The device contains a 128-bits One-Time Programmable memory. This OTP memory is used for the following purposes: 1. 86 bits data + 3 bits CRC for critical parameters trimming: bandgaps, oscillators, reference currents, firing currents, DC sensor and RSU interface parameters. 2. 18 bits data for other blocks trimming: ADC, ER Cap Measurement 3. 20 bits data for die and wafer traceability 4. 1 bit for debug purpose User read/write access to the OTP memory via SPI is only possible during production testing and require activation of a special test mode. During mission mode, the trimming bits are automatically read from OTP and transferred to the related circuits at each POR cycle. During this operation, actual CRC of the protected trimming data is calculated and checked against the expected CRC stored in the OTP. In case of CRC check failure the OTPCRC_ERR flag is set in the FLTSR register. |
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