производитель | номер детали | датащи | подробное описание детали |
Aries Electronics, Inc. |
289-PRS17001-12
|
653Kb / 2P |
PGA ZIF Test & Burn-in Socket for Any Footprint on Std 8x8 to 21x21 Grid
Rev. 1.10 |
10004HT
|
1Mb / 2P |
High-Temp PGA ZIF Test & Burn-in Socket for Footprints on Std 8x8 to 21x21 Grid
|
Abracon Corporation |
AXS-1147-02-02
|
419Kb / 1P |
CRYSTAL TEST & BURN IN SOCKET
08.21.09 |
Aries Electronics, Inc. |
10002
|
716Kb / 1P |
High-Temp Universal ZIF DIP Burn-in & Test Socket
|
Abracon Corporation |
AXS-1155-04-01
|
410Kb / 1P |
CRYSTAL TEST & BURN-IN SOCKET
07.10.09 |
AXS-7050-06-13
|
411Kb / 1P |
CRYSTAL OSCILLATOR TEST & BURN IN SOCKET
07.13.09 |
AXS-7550-06-03
|
412Kb / 1P |
CRYSTAL OSCILLATOR TEST & BURN IN SOCKET
07.13.09 |
AXS-2520-04-01
|
403Kb / 1P |
CRYSTAL OSCILLATOR TEST & BURN IN SOCKET
07.10.09 |
AXS-2520-04-05
|
402Kb / 1P |
Suitable for high temperature burn-in test
07.10.09 |
AXS-2520-04-07
|
391Kb / 1P |
Suitable for high temperature burn-in test
07.10.09 |