| производитель | номер детали | датащи | подробное описание детали |

Fairchild Semiconductor
|
AN-9016 |
1,001Kb/18P |
IGBT Basics |

STMicroelectronics
|
AN2795 |
856Kb/28P |
VNI4140K load test report |

Fairchild Semiconductor
|
AN-9010 |
973Kb/17P |
MOSFET Basics |

DB Lectro Inc
|
MS-320-3 |
353Kb/3P |
Reed Sensor Basics |

Analog Devices
|
MT-022 |
295Kb/12P |
ADC Architectures III: Sigma-Delta ADC Basics Rev.A, 10/08, WK |

Fairchild Semiconductor
|
AN-9721 |
130Kb/4P |
Li-Ion Battery Charging Basics |

PHOENIX CONTACT
|
2739382 |
48Kb/1P |
License - PC WORX 3.0X BUILDING BASICS 11/05/2018 |

Schurter Inc.
|
0040.1021 |
116Kb/1P |
TEST JACKS, TEST PROBES |
| 0040.1211 |
377Kb/1P |
TEST JACKS, TEST PROBES |
| 0040.1031 |
26Kb/1P |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN |
| 0040.1061 |
48Kb/1P |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN |
| 0040.1011 |
28Kb/1P |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN |

Hirose Electric
|
TR0636E-20009 |
604Kb/11P |
IT3 Test Vehicle Assembly Yield Test |

Schurter Inc.
|
0040.1281 |
27Kb/1P |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN |

List of Unclassifed Man...
|
5340-1 |
1Mb/1P |
Test Resistor |

Micross Components
|
HMC405 |
830Kb/9P |
Test Equipment |
| HMC579 |
863Kb/9P |
Test Instrumentation |

Analog Devices
|
HMC448LC3B |
340Kb/6P |
Test Instrumentation |
| HMC561 |
391Kb/6P |
Test Instrumentation |
| HMC579 |
298Kb/6P |
Test Instrumentation |